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Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132
Figure 1: TEM image of four different tips employed in the dAFM experiments. The tips are referred to as (a) ...
Figure 2: Schematic of the non-contact/free resonance and contact resonance frequencies of the AFM cantilever...
Figure 3: AFM (a) topographic and (b) reverse scan direction lateral force maps of the HOPG obtained by FMM. ...
Figure 4: (a) Topographic and (b) lateral force maps acquired in the forward scan direction on uncovered and ...
Figure 5: Line profile of (a) amplitude and (b) phase at uncovered steps acquired with the CR-mode at a conta...
Figure 6: (a) AFM topographic map of a third area of the HOPG surface containing both uncovered and covered s...
Figure 7: (a) Amplitude map obtained while the tip traversed four single-height, uncovered atomic steps on an...
Figure 8: (a) Amplitude map obtained while the tip traversed two single-height uncovered atomic steps on an H...
Figure 9: (a) Schematic of the physical construction of the cantilever. A piezo actuator (blue rectangle) exc...
Figure 10: (a) AFM topography image, (b) amplitude, (c) corresponding converted contact stiffness and (d) corr...
Figure 11: Force–distance curve from the static indentation measurement on an HOPG surface using a cantilever ...
Figure 12: The elastic modulus map according to the grid pattern in four lines, where each line includes 64 ro...